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Three-dimensional structure of dislocations in silicon determined by synchrotron white x-ray topography combined with a topo-tomographic technique.

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Bibliographic Details
Title: Three-dimensional structure of dislocations in silicon determined by synchrotron white x-ray topography combined with a topo-tomographic technique.
Authors: Kawado, S., Taishi, T., Iida, S.
Source: Journal of Physics: D Applied Physics; May 21 2005, Vol. 38, pA17-A22, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501087083
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Three-dimensional structure of dislocations in silicon determined by synchrotron white x-ray topography combined with a topo-tomographic technique.
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  Data: <searchLink fieldCode="AU" term="%22Kawado%2C+S%2E%22">Kawado, S.</searchLink><br /><searchLink fieldCode="AU" term="%22Taishi%2C+T%2E%22">Taishi, T.</searchLink><br /><searchLink fieldCode="AU" term="%22Iida%2C+S%2E%22">Iida, S.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Physics%3A+D+Applied+Physics%22">Journal of Physics: D Applied Physics</searchLink>; May 21 2005, Vol. 38, pA17-A22, 6p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501087083
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1088/0022-3727/38/10A/004
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 6
        StartPage: A17
    Titles:
      – TitleFull: Three-dimensional structure of dislocations in silicon determined by synchrotron white x-ray topography combined with a topo-tomographic technique.
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            NameFull: Kawado, S.
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            NameFull: Taishi, T.
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            NameFull: Iida, S.
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            – D: 22
              M: 05
              Text: May 21 2005
              Type: published
              Y: 2005
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              Value: 38
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            – TitleFull: Journal of Physics: D Applied Physics
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