Plane-wave synchrotron x-ray topography observation of grown-in microdefects in a slowly pulled CZ-silicon crystal.
Saved in:
| Title: | Plane-wave synchrotron x-ray topography observation of grown-in microdefects in a slowly pulled CZ-silicon crystal. |
|---|---|
| Authors: | Iida, S., Kawado, S., Maehama, T. |
| Source: | Journal of Physics: D Applied Physics; May 21 2005, Vol. 38, pA23-A27, 5p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00223727 |
|---|---|
| DOI: | 10.1088/0022-3727/38/10A/005 |
