APA (7th ed.) Citation

Iida, S., Kawado, S., & Maehama, T. (2005). Plane-wave synchrotron x-ray topography observation of grown-in microdefects in a slowly pulled CZ-silicon crystal. Journal of Physics: D Applied Physics, 38, A23. https://doi.org/10.1088/0022-3727/38/10A/005

Chicago Style (17th ed.) Citation

Iida, S., S. Kawado, and T. Maehama. "Plane-wave Synchrotron X-ray Topography Observation of Grown-in Microdefects in a Slowly Pulled CZ-silicon Crystal." Journal of Physics: D Applied Physics 38 (2005): A23. https://doi.org/10.1088/0022-3727/38/10A/005.

MLA (9th ed.) Citation

Iida, S., et al. "Plane-wave Synchrotron X-ray Topography Observation of Grown-in Microdefects in a Slowly Pulled CZ-silicon Crystal." Journal of Physics: D Applied Physics, vol. 38, 2005, p. A23, https://doi.org/10.1088/0022-3727/38/10A/005.