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Plane-wave synchrotron x-ray topography observation of grown-in microdefects in a slowly pulled CZ-silicon crystal.

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Bibliographic Details
Title: Plane-wave synchrotron x-ray topography observation of grown-in microdefects in a slowly pulled CZ-silicon crystal.
Authors: Iida, S., Kawado, S., Maehama, T.
Source: Journal of Physics: D Applied Physics; May 21 2005, Vol. 38, pA23-A27, 5p
Database: Applied Science & Technology Source
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