Materials Characterization Using High-Resolution Scanning-Electron Microscopy and X-ray Microanalysis.

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Bibliographic Details
Title:	Materials Characterization Using High-Resolution Scanning-Electron Microscopy and X-ray Microanalysis.
Authors:	Gauvin, Raynald, Robertson, Kevin, Horny, Paula
Source:	JOM: The Journal of The Minerals, Metals & Materials Society (TMS); March 2006, Vol. 58 Issue 3, p20-26, 7p
Database:	Applied Science & Technology Source

Description
ISSN:	10474838
DOI:	10.1007/s11837-006-0155-0