Gauvin, R., Robertson, K., & Horny, P. (2006). Materials Characterization Using High-Resolution Scanning-Electron Microscopy and X-ray Microanalysis. JOM: The Journal of The Minerals, Metals & Materials Society (TMS), 58(3), 20. https://doi.org/10.1007/s11837-006-0155-0
Chicago Style (17th ed.) CitationGauvin, Raynald, Kevin Robertson, and Paula Horny. "Materials Characterization Using High-Resolution Scanning-Electron Microscopy and X-ray Microanalysis." JOM: The Journal of The Minerals, Metals & Materials Society (TMS) 58, no. 3 (2006): 20. https://doi.org/10.1007/s11837-006-0155-0.
MLA (9th ed.) CitationGauvin, Raynald, et al. "Materials Characterization Using High-Resolution Scanning-Electron Microscopy and X-ray Microanalysis." JOM: The Journal of The Minerals, Metals & Materials Society (TMS), vol. 58, no. 3, 2006, p. 20, https://doi.org/10.1007/s11837-006-0155-0.