Measurement of Single-Event Effects on a Large Number of Commercial DRAMs.
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| Title: | Measurement of Single-Event Effects on a Large Number of Commercial DRAMs. |
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| Authors: | Sasada, T., Ichikawa, S., Kanai, T. |
| Source: | IEEE Transactions on Nuclear Science; August 2006 pt1, Vol. 53 Issue 4, p1806-1812, 7p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00189499 |
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| DOI: | 10.1109/TNS.2006.880928 |
