APA (7th ed.) Citation

Sasada, T., Ichikawa, S., & Kanai, T. (2006). Measurement of Single-Event Effects on a Large Number of Commercial DRAMs. IEEE Transactions on Nuclear Science, 53(4), 1806. https://doi.org/10.1109/TNS.2006.880928

Chicago Style (17th ed.) Citation

Sasada, T., S. Ichikawa, and T. Kanai. "Measurement of Single-Event Effects on a Large Number of Commercial DRAMs." IEEE Transactions on Nuclear Science 53, no. 4 (2006): 1806. https://doi.org/10.1109/TNS.2006.880928.

MLA (9th ed.) Citation

Sasada, T., et al. "Measurement of Single-Event Effects on a Large Number of Commercial DRAMs." IEEE Transactions on Nuclear Science, vol. 53, no. 4, 2006, p. 1806, https://doi.org/10.1109/TNS.2006.880928.