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Measurement of Single-Event Effects on a Large Number of Commercial DRAMs.

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Bibliographic Details
Title: Measurement of Single-Event Effects on a Large Number of Commercial DRAMs.
Authors: Sasada, T., Ichikawa, S., Kanai, T.
Source: IEEE Transactions on Nuclear Science; August 2006 pt1, Vol. 53 Issue 4, p1806-1812, 7p
Database: Applied Science & Technology Source
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