Measuring Stress Distributions in Ti-6Al-4V Using Synchrotron X-Ray Diffraction.

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Bibliographic Details
Title:	Measuring Stress Distributions in Ti-6Al-4V Using Synchrotron X-Ray Diffraction.
Authors:	Bernier, J. V., Park, J.-S., Pilchak, A. L.
Source:	Metallurgical & Materials Transactions. Part A; Dec2008, Vol. 39A Issue 13, p3120-3133, 14p
Database:	Applied Science & Technology Source

Description
ISSN:	10735623
DOI:	10.1007/s11661-008-9639-6