APA (7th ed.) Citation

Bernier, J. V., Park, J., & Pilchak, A. L. (2008). Measuring Stress Distributions in Ti-6Al-4V Using Synchrotron X-Ray Diffraction. Metallurgical & Materials Transactions. Part A, 39A(13), 3120. https://doi.org/10.1007/s11661-008-9639-6

Chicago Style (17th ed.) Citation

Bernier, J. V., J.-S Park, and A. L. Pilchak. "Measuring Stress Distributions in Ti-6Al-4V Using Synchrotron X-Ray Diffraction." Metallurgical & Materials Transactions. Part A 39A, no. 13 (2008): 3120. https://doi.org/10.1007/s11661-008-9639-6.

MLA (9th ed.) Citation

Bernier, J. V., et al. "Measuring Stress Distributions in Ti-6Al-4V Using Synchrotron X-Ray Diffraction." Metallurgical & Materials Transactions. Part A, vol. 39A, no. 13, 2008, p. 3120, https://doi.org/10.1007/s11661-008-9639-6.