Measuring Stress Distributions in Ti-6Al-4V Using Synchrotron X-Ray Diffraction.
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| Title: | Measuring Stress Distributions in Ti-6Al-4V Using Synchrotron X-Ray Diffraction. |
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| Authors: | Bernier, J. V., Park, J.-S., Pilchak, A. L. |
| Source: | Metallurgical & Materials Transactions. Part A; Dec2008, Vol. 39A Issue 13, p3120-3133, 14p |
| Database: | Applied Science & Technology Source |
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