Liu, J. H., Pei, Z. J., & Fisher, G. R. (2007). Investigations of silicon wafer grinding using finite element analysis. International Journal of Computer Applications in Technology, 29(2/4), 102. https://doi.org/10.1504/IJCAT.2007.015243
Chicago Style (17th ed.) CitationLiu, J. H., Z. J. Pei, and G. R. Fisher. "Investigations of Silicon Wafer Grinding Using Finite Element Analysis." International Journal of Computer Applications in Technology 29, no. 2/4 (2007): 102. https://doi.org/10.1504/IJCAT.2007.015243.
MLA (9th ed.) CitationLiu, J. H., et al. "Investigations of Silicon Wafer Grinding Using Finite Element Analysis." International Journal of Computer Applications in Technology, vol. 29, no. 2/4, 2007, p. 102, https://doi.org/10.1504/IJCAT.2007.015243.