Process, Temperature, and Supply-Noise Tolerant 45 nm Dense Cache Arrays With Diffusion-Notch-Free (DNF) 6T SRAM Cells and Dynamic Multi-Vcc Circuits.

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Bibliographic Details
Title: Process, Temperature, and Supply-Noise Tolerant 45 nm Dense Cache Arrays With Diffusion-Notch-Free (DNF) 6T SRAM Cells and Dynamic Multi-Vcc Circuits.
Authors: Khellah, Muhammad, Kim, Nam Sung, Ye, Yibin
Source: IEEE Journal of Solid-State Circuits; April 2009, Vol. 44 Issue 4, p1199-1208, 10p
Database: Applied Science & Technology Source
Description
ISSN:00189200
DOI:10.1109/JSSC.2009.2014015