Khellah, M., Kim, N. S., & Ye, Y. (2009). Process, Temperature, and Supply-Noise Tolerant 45 nm Dense Cache Arrays With Diffusion-Notch-Free (DNF) 6T SRAM Cells and Dynamic Multi-Vcc Circuits. IEEE Journal of Solid-State Circuits, 44(4), 1199. https://doi.org/10.1109/JSSC.2009.2014015
Chicago Style (17th ed.) CitationKhellah, Muhammad, Nam Sung Kim, and Yibin Ye. "Process, Temperature, and Supply-Noise Tolerant 45 Nm Dense Cache Arrays With Diffusion-Notch-Free (DNF) 6T SRAM Cells and Dynamic Multi-Vcc Circuits." IEEE Journal of Solid-State Circuits 44, no. 4 (2009): 1199. https://doi.org/10.1109/JSSC.2009.2014015.
MLA (9th ed.) CitationKhellah, Muhammad, et al. "Process, Temperature, and Supply-Noise Tolerant 45 Nm Dense Cache Arrays With Diffusion-Notch-Free (DNF) 6T SRAM Cells and Dynamic Multi-Vcc Circuits." IEEE Journal of Solid-State Circuits, vol. 44, no. 4, 2009, p. 1199, https://doi.org/10.1109/JSSC.2009.2014015.