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Process, Temperature, and Supply-Noise Tolerant 45 nm Dense Cache Arrays With Diffusion-Notch-Free (DNF) 6T SRAM Cells and Dynamic Multi-Vcc Circuits.

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Title: Process, Temperature, and Supply-Noise Tolerant 45 nm Dense Cache Arrays With Diffusion-Notch-Free (DNF) 6T SRAM Cells and Dynamic Multi-Vcc Circuits.
Authors: Khellah, Muhammad, Kim, Nam Sung, Ye, Yibin
Source: IEEE Journal of Solid-State Circuits; April 2009, Vol. 44 Issue 4, p1199-1208, 10p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501411594
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Process, Temperature, and Supply-Noise Tolerant 45 nm Dense Cache Arrays With Diffusion-Notch-Free (DNF) 6T SRAM Cells and Dynamic Multi-Vcc Circuits.
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  Data: <searchLink fieldCode="AU" term="%22Khellah%2C+Muhammad%22">Khellah, Muhammad</searchLink><br /><searchLink fieldCode="AU" term="%22Kim%2C+Nam+Sung%22">Kim, Nam Sung</searchLink><br /><searchLink fieldCode="AU" term="%22Ye%2C+Yibin%22">Ye, Yibin</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Journal+of+Solid-State+Circuits%22">IEEE Journal of Solid-State Circuits</searchLink>; April 2009, Vol. 44 Issue 4, p1199-1208, 10p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501411594
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1109/JSSC.2009.2014015
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      – Code: eng
        Text: English
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        PageCount: 10
        StartPage: 1199
    Titles:
      – TitleFull: Process, Temperature, and Supply-Noise Tolerant 45 nm Dense Cache Arrays With Diffusion-Notch-Free (DNF) 6T SRAM Cells and Dynamic Multi-Vcc Circuits.
        Type: main
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            NameFull: Khellah, Muhammad
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            NameFull: Kim, Nam Sung
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            NameFull: Ye, Yibin
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              Text: April 2009
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              Y: 2009
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              Value: 44
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            – TitleFull: IEEE Journal of Solid-State Circuits
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