Nature of interfacial defects and their roles in strain relaxation at highly lattice mismatched 3C-SiC/Si (001) interface.

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Bibliographic Details
Title: Nature of interfacial defects and their roles in strain relaxation at highly lattice mismatched 3C-SiC/Si (001) interface.
Authors: Wen, C., Wang, Y. M., Wan, W.
Source: Journal of Applied Physics; October 1 2009, Vol. 106 Issue 7, p073522-1-073522-8, 8p
Database: Applied Science & Technology Source
Description
ISSN:00218979
DOI:10.1063/1.3234380