Development of a surface conductivity measurement system for ultrahigh vacuum transmission electron microscope.

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Bibliographic Details
Title:	Development of a surface conductivity measurement system for ultrahigh vacuum transmission electron microscope.
Authors:	Minoda, H., Hatano, K., Yazawa, H.
Source:	Review of Scientific Instruments; November 2009, Vol. 80 Issue 11, p113702-1-113702-4, 4p
Database:	Applied Science & Technology Source

Description
ISSN:	00346748
DOI:	10.1063/1.3251272