Minoda, H., Hatano, K., & Yazawa, H. (2009). Development of a surface conductivity measurement system for ultrahigh vacuum transmission electron microscope. Review of Scientific Instruments, 80(11), 113702-1. https://doi.org/10.1063/1.3251272
Chicago Style (17th ed.) CitationMinoda, H., K. Hatano, and H. Yazawa. "Development of a Surface Conductivity Measurement System for Ultrahigh Vacuum Transmission Electron Microscope." Review of Scientific Instruments 80, no. 11 (2009): 113702-1. https://doi.org/10.1063/1.3251272.
MLA (9th ed.) CitationMinoda, H., et al. "Development of a Surface Conductivity Measurement System for Ultrahigh Vacuum Transmission Electron Microscope." Review of Scientific Instruments, vol. 80, no. 11, 2009, pp. 113702-1, https://doi.org/10.1063/1.3251272.