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Development of a surface conductivity measurement system for ultrahigh vacuum transmission electron microscope.

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Title: Development of a surface conductivity measurement system for ultrahigh vacuum transmission electron microscope.
Authors: Minoda, H., Hatano, K., Yazawa, H.
Source: Review of Scientific Instruments; November 2009, Vol. 80 Issue 11, p113702-1-113702-4, 4p
Database: Applied Science & Technology Source
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        Value: 10.1063/1.3251272
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        Text: English
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              Text: November 2009
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