Comprehensive Noise Characterization and Modeling for 65-nm MOSFETs for Millimeter-Wave Applications.
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| Title: | Comprehensive Noise Characterization and Modeling for 65-nm MOSFETs for Millimeter-Wave Applications. |
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| Authors: | Wang, Sheng-Chun, Su, Pin, Chen, Kun-Ming |
| Source: | IEEE Transactions on Microwave Theory & Techniques; April 2010, Vol. 58 Issue 4, p740-746, 7p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00189480 |
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| DOI: | 10.1109/TMTT.2010.2041582 |
