APA (7th ed.) Citation

Wang, S., Su, P., & Chen, K. (2010). Comprehensive Noise Characterization and Modeling for 65-nm MOSFETs for Millimeter-Wave Applications. IEEE Transactions on Microwave Theory & Techniques, 58(4), 740. https://doi.org/10.1109/TMTT.2010.2041582

Chicago Style (17th ed.) Citation

Wang, Sheng-Chun, Pin Su, and Kun-Ming Chen. "Comprehensive Noise Characterization and Modeling for 65-nm MOSFETs for Millimeter-Wave Applications." IEEE Transactions on Microwave Theory & Techniques 58, no. 4 (2010): 740. https://doi.org/10.1109/TMTT.2010.2041582.

MLA (9th ed.) Citation

Wang, Sheng-Chun, et al. "Comprehensive Noise Characterization and Modeling for 65-nm MOSFETs for Millimeter-Wave Applications." IEEE Transactions on Microwave Theory & Techniques, vol. 58, no. 4, 2010, p. 740, https://doi.org/10.1109/TMTT.2010.2041582.