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Comprehensive Noise Characterization and Modeling for 65-nm MOSFETs for Millimeter-Wave Applications.

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Title: Comprehensive Noise Characterization and Modeling for 65-nm MOSFETs for Millimeter-Wave Applications.
Authors: Wang, Sheng-Chun, Su, Pin, Chen, Kun-Ming
Source: IEEE Transactions on Microwave Theory & Techniques; April 2010, Vol. 58 Issue 4, p740-746, 7p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501577473
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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        Value: 10.1109/TMTT.2010.2041582
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      – Code: eng
        Text: English
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        PageCount: 7
        StartPage: 740
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      – TitleFull: Comprehensive Noise Characterization and Modeling for 65-nm MOSFETs for Millimeter-Wave Applications.
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            NameFull: Wang, Sheng-Chun
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            NameFull: Su, Pin
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              Text: April 2010
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              Y: 2010
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