Universal Tunnel Mass and Charge Trapping in [(SiO2)1—x(Si3N4)x]1—ySiy Film.
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| Title: | Universal Tunnel Mass and Charge Trapping in [(SiO2)1—x(Si3N4)x]1—ySiy Film. |
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| Authors: | Watanabe, Hiroshi, Matsushita, Daisuke, Muraoka, Kouichi |
| Source: | IEEE Transactions on Electron Devices; May 2010, Vol. 57 Issue 5, p1129-1136, 8p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00189383 |
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| DOI: | 10.1109/TED.2010.2044676 |
