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Universal Tunnel Mass and Charge Trapping in [(SiO2)1—x(Si3N4)x]1—ySiy Film.

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Title: Universal Tunnel Mass and Charge Trapping in [(SiO2)1—x(Si3N4)x]1—ySiy Film.
Authors: Watanabe, Hiroshi, Matsushita, Daisuke, Muraoka, Kouichi
Source: IEEE Transactions on Electron Devices; May 2010, Vol. 57 Issue 5, p1129-1136, 8p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501601666
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Universal Tunnel Mass and Charge Trapping in [(SiO2)1—x(Si3N4)x]1—ySiy Film.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Watanabe%2C+Hiroshi%22">Watanabe, Hiroshi</searchLink><br /><searchLink fieldCode="AU" term="%22Matsushita%2C+Daisuke%22">Matsushita, Daisuke</searchLink><br /><searchLink fieldCode="AU" term="%22Muraoka%2C+Kouichi%22">Muraoka, Kouichi</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Electron+Devices%22">IEEE Transactions on Electron Devices</searchLink>; May 2010, Vol. 57 Issue 5, p1129-1136, 8p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501601666
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/TED.2010.2044676
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 8
        StartPage: 1129
    Titles:
      – TitleFull: Universal Tunnel Mass and Charge Trapping in [(SiO2)1—x(Si3N4)x]1—ySiy Film.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Watanabe, Hiroshi
      – PersonEntity:
          Name:
            NameFull: Matsushita, Daisuke
      – PersonEntity:
          Name:
            NameFull: Muraoka, Kouichi
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 05
              Text: May 2010
              Type: published
              Y: 2010
          Identifiers:
            – Type: issn-print
              Value: 00189383
          Numbering:
            – Type: volume
              Value: 57
            – Type: issue
              Value: 5
          Titles:
            – TitleFull: IEEE Transactions on Electron Devices
              Type: main
ResultId 1