Fault tolerance and reliability in field-programmable gate arrays.

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Bibliographic Details
Title:	Fault tolerance and reliability in field-programmable gate arrays.
Authors:	Stott, E., Sedcole, P., Cheung, P.
Source:	IET Computers & Digital Techniques; May 2010, Vol. 4 Issue 3, p196-210, 15p
Database:	Applied Science & Technology Source

Description
ISSN:	17518601
DOI:	10.1049/iet-cdt.2009.0011