APA (7th ed.) Citation

Stott, E., Sedcole, P., & Cheung, P. (2010). Fault tolerance and reliability in field-programmable gate arrays. IET Computers & Digital Techniques, 4(3), 196. https://doi.org/10.1049/iet-cdt.2009.0011

Chicago Style (17th ed.) Citation

Stott, E., P. Sedcole, and P. Cheung. "Fault Tolerance and Reliability in Field-programmable Gate Arrays." IET Computers & Digital Techniques 4, no. 3 (2010): 196. https://doi.org/10.1049/iet-cdt.2009.0011.

MLA (9th ed.) Citation

Stott, E., et al. "Fault Tolerance and Reliability in Field-programmable Gate Arrays." IET Computers & Digital Techniques, vol. 4, no. 3, 2010, p. 196, https://doi.org/10.1049/iet-cdt.2009.0011.