On Clustering of Undetectable Single Stuck-At Faults and Test Quality in Full-Scan Circuits.
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| Title: | On Clustering of Undetectable Single Stuck-At Faults and Test Quality in Full-Scan Circuits. |
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| Authors: | Pomeranz, Irith, Reddy, Sudhakar M. |
| Source: | IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; July 2010, Vol. 29 Issue 7, p1135-1140, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 02780070 |
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| DOI: | 10.1109/TCAD.2010.2046448 |
