APA (7th ed.) Citation

Pomeranz, I., & Reddy, S. M. (2010). On Clustering of Undetectable Single Stuck-At Faults and Test Quality in Full-Scan Circuits. IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, 29(7), 1135. https://doi.org/10.1109/TCAD.2010.2046448

Chicago Style (17th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "On Clustering of Undetectable Single Stuck-At Faults and Test Quality in Full-Scan Circuits." IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems 29, no. 7 (2010): 1135. https://doi.org/10.1109/TCAD.2010.2046448.

MLA (9th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "On Clustering of Undetectable Single Stuck-At Faults and Test Quality in Full-Scan Circuits." IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, vol. 29, no. 7, 2010, p. 1135, https://doi.org/10.1109/TCAD.2010.2046448.