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On Clustering of Undetectable Single Stuck-At Faults and Test Quality in Full-Scan Circuits.

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Bibliographic Details
Title: On Clustering of Undetectable Single Stuck-At Faults and Test Quality in Full-Scan Circuits.
Authors: Pomeranz, Irith, Reddy, Sudhakar M.
Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; July 2010, Vol. 29 Issue 7, p1135-1140, 6p
Database: Applied Science & Technology Source
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