Retardation of nucleation rate for grain size enhancement by deep silicon ion implantation of low-pressure chemical vapor deposited amorphous silicon films.

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Bibliographic Details
Title: Retardation of nucleation rate for grain size enhancement by deep silicon ion implantation of low-pressure chemical vapor deposited amorphous silicon films.
Authors: Wu, I.-W., Chiang, A., Fuse, M.
Source: Journal of Applied Physics; May 15 1989, Vol. 65, p4036-4039, 4p
Database: Applied Science & Technology Source
Description
ISSN:00218979
DOI:10.1063/1.343327