Switching Activity as a Test Compaction Heuristic for Transition Faults.
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| Title: | Switching Activity as a Test Compaction Heuristic for Transition Faults. |
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| Authors: | Pomeranz, Irith, Reddy, Sudhakar M. |
| Source: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems; September 2010, Vol. 18 Issue 9, p1357-1361, 5p |
| Database: | Applied Science & Technology Source |
| ISSN: | 10638210 |
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| DOI: | 10.1109/TVLSI.2009.2022474 |
