APA (7th ed.) Citation

Pomeranz, I., & Reddy, S. M. (2010). Switching Activity as a Test Compaction Heuristic for Transition Faults. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 18(9), 1357. https://doi.org/10.1109/TVLSI.2009.2022474

Chicago Style (17th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "Switching Activity as a Test Compaction Heuristic for Transition Faults." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 18, no. 9 (2010): 1357. https://doi.org/10.1109/TVLSI.2009.2022474.

MLA (9th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "Switching Activity as a Test Compaction Heuristic for Transition Faults." IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 18, no. 9, 2010, p. 1357, https://doi.org/10.1109/TVLSI.2009.2022474.