Microanalysis on the (200) diffraction intensity to determine the Al concentrations for AlGaAs-GaAs multiple-quantum-well structures.
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| Title: | Microanalysis on the (200) diffraction intensity to determine the Al concentrations for AlGaAs-GaAs multiple-quantum-well structures. |
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| Authors: | Ou, H.-J., Cowley, J. M., Chyi, J. I. |
| Source: | Journal of Applied Physics; January 15 1990, Vol. 67, p698-704, 7p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.345774 |
