APA (7th ed.) Citation

Ou, H., Cowley, J. M., & Chyi, J. I. (1990). Microanalysis on the (200) diffraction intensity to determine the Al concentrations for AlGaAs-GaAs multiple-quantum-well structures. Journal of Applied Physics, 67, 698. https://doi.org/10.1063/1.345774

Chicago Style (17th ed.) Citation

Ou, H.-J, J. M. Cowley, and J. I. Chyi. "Microanalysis on the (200) Diffraction Intensity to Determine the Al Concentrations for AlGaAs-GaAs Multiple-quantum-well Structures." Journal of Applied Physics 67 (1990): 698. https://doi.org/10.1063/1.345774.

MLA (9th ed.) Citation

Ou, H.-J, et al. "Microanalysis on the (200) Diffraction Intensity to Determine the Al Concentrations for AlGaAs-GaAs Multiple-quantum-well Structures." Journal of Applied Physics, vol. 67, 1990, p. 698, https://doi.org/10.1063/1.345774.