Fixed-State Tests for Delay Faults in Scan Designs.
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| Title: | Fixed-State Tests for Delay Faults in Scan Designs. |
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| Authors: | Pomeranz, Irith, Reddy, Sudhakar M. |
| Source: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems; January 2011, Vol. 19 Issue 1, p142-146, 5p |
| Database: | Applied Science & Technology Source |
| ISSN: | 10638210 |
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| DOI: | 10.1109/TVLSI.2009.2030811 |
