JIC data analysis methods with a “negative crack growth” correction procedure.

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Bibliographic Details
Title: JIC data analysis methods with a “negative crack growth” correction procedure.
Authors: Rosenthal, Y. A., Tobler, R. L., Purtscher, P. T.
Source: Journal of Testing & Evaluation; July 1990, Vol. 18, p301-304, 4p
Database: Applied Science & Technology Source
Description
ISSN:00903973
DOI:10.1520/JTE12488J