Rosenthal, Y. A., Tobler, R. L., & Purtscher, P. T. (1990). JIC data analysis methods with a “negative crack growth” correction procedure. Journal of Testing & Evaluation, 18, 301. https://doi.org/10.1520/JTE12488J
Chicago Style (17th ed.) CitationRosenthal, Y. A., R. L. Tobler, and P. T. Purtscher. "JIC Data Analysis Methods with a “negative Crack Growth” Correction Procedure." Journal of Testing & Evaluation 18 (1990): 301. https://doi.org/10.1520/JTE12488J.
MLA (9th ed.) CitationRosenthal, Y. A., et al. "JIC Data Analysis Methods with a “negative Crack Growth” Correction Procedure." Journal of Testing & Evaluation, vol. 18, 1990, p. 301, https://doi.org/10.1520/JTE12488J.
Warning: These citations may not always be 100% accurate.