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JIC data analysis methods with a “negative crack growth” correction procedure.

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Bibliographic Details
Title: JIC data analysis methods with a “negative crack growth” correction procedure.
Authors: Rosenthal, Y. A., Tobler, R. L., Purtscher, P. T.
Source: Journal of Testing & Evaluation; July 1990, Vol. 18, p301-304, 4p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501766327
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: <searchLink fieldCode="AU" term="%22Rosenthal%2C+Y%2E+A%2E%22">Rosenthal, Y. A.</searchLink><br /><searchLink fieldCode="AU" term="%22Tobler%2C+R%2E+L%2E%22">Tobler, R. L.</searchLink><br /><searchLink fieldCode="AU" term="%22Purtscher%2C+P%2E+T%2E%22">Purtscher, P. T.</searchLink>
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      – Type: doi
        Value: 10.1520/JTE12488J
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      – Code: eng
        Text: English
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        PageCount: 4
        StartPage: 301
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      – TitleFull: JIC data analysis methods with a “negative crack growth” correction procedure.
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            NameFull: Rosenthal, Y. A.
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            NameFull: Tobler, R. L.
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            NameFull: Purtscher, P. T.
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            – D: 01
              M: 07
              Text: July 1990
              Type: published
              Y: 1990
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              Value: 18
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            – TitleFull: Journal of Testing & Evaluation
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