Investigation of High-Frequency Noise Characteristics in Tensile-Strained nMOSFETs.
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| Title: | Investigation of High-Frequency Noise Characteristics in Tensile-Strained nMOSFETs. |
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| Authors: | Wang, Sheng-Chun, Su, Pin, Chen, Kun-Ming |
| Source: | IEEE Transactions on Electron Devices; March 2011, Vol. 58 Issue 3, p895-900, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00189383 |
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| DOI: | 10.1109/TED.2010.2104153 |
