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Investigation of High-Frequency Noise Characteristics in Tensile-Strained nMOSFETs.

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Bibliographic Details
Title: Investigation of High-Frequency Noise Characteristics in Tensile-Strained nMOSFETs.
Authors: Wang, Sheng-Chun, Su, Pin, Chen, Kun-Ming
Source: IEEE Transactions on Electron Devices; March 2011, Vol. 58 Issue 3, p895-900, 6p
Database: Applied Science & Technology Source
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