Electron-impact ionization time-of-flight mass spectrometer for molecular beams.

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Bibliographic Details
Title:	Electron-impact ionization time-of-flight mass spectrometer for molecular beams.
Authors:	Pollard, J. E., Cohen, R. B.
Source:	Review of Scientific Instruments; January 1987, Vol. 58, p32-37, 6p
Database:	Applied Science & Technology Source

Description
ISSN:	00346748
DOI:	10.1063/1.1139562