Electron-impact ionization time-of-flight mass spectrometer for molecular beams.
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| Title: | Electron-impact ionization time-of-flight mass spectrometer for molecular beams. |
|---|---|
| Authors: | Pollard, J. E., Cohen, R. B. |
| Source: | Review of Scientific Instruments; January 1987, Vol. 58, p32-37, 6p |
| Database: | Applied Science & Technology Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 501828776 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Electron-impact ionization time-of-flight mass spectrometer for molecular beams. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Pollard%2C+J%2E+E%2E%22">Pollard, J. E.</searchLink><br /><searchLink fieldCode="AU" term="%22Cohen%2C+R%2E+B%2E%22">Cohen, R. B.</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Review+of+Scientific+Instruments%22">Review of Scientific Instruments</searchLink>; January 1987, Vol. 58, p32-37, 6p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501828776 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1063/1.1139562 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 6 StartPage: 32 Titles: – TitleFull: Electron-impact ionization time-of-flight mass spectrometer for molecular beams. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Pollard, J. E. – PersonEntity: Name: NameFull: Cohen, R. B. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 01 Text: January 1987 Type: published Y: 1987 Identifiers: – Type: issn-print Value: 00346748 Numbering: – Type: volume Value: 58 Titles: – TitleFull: Review of Scientific Instruments Type: main |
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