Raman-microprobe study of stress and crystal orientation in laser-crystallized silicon.
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| Title: | Raman-microprobe study of stress and crystal orientation in laser-crystallized silicon. |
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| Authors: | Kolb, G., Salbert, Th, Abstreiter, G. |
| Source: | Journal of Applied Physics; March 1 1991, Vol. 69, p3387-3389, 3p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.348516 |
