APA (7th ed.) Citation

Kolb, G., Salbert, T., & Abstreiter, G. (1991). Raman-microprobe study of stress and crystal orientation in laser-crystallized silicon. Journal of Applied Physics, 69, 3387. https://doi.org/10.1063/1.348516

Chicago Style (17th ed.) Citation

Kolb, G., Th Salbert, and G. Abstreiter. "Raman-microprobe Study of Stress and Crystal Orientation in Laser-crystallized Silicon." Journal of Applied Physics 69 (1991): 3387. https://doi.org/10.1063/1.348516.

MLA (9th ed.) Citation

Kolb, G., et al. "Raman-microprobe Study of Stress and Crystal Orientation in Laser-crystallized Silicon." Journal of Applied Physics, vol. 69, 1991, p. 3387, https://doi.org/10.1063/1.348516.