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Raman-microprobe study of stress and crystal orientation in laser-crystallized silicon.

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Bibliographic Details
Title: Raman-microprobe study of stress and crystal orientation in laser-crystallized silicon.
Authors: Kolb, G., Salbert, Th, Abstreiter, G.
Source: Journal of Applied Physics; March 1 1991, Vol. 69, p3387-3389, 3p
Database: Applied Science & Technology Source
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