Experimental apparatus for measuring noise in MOSFETs on silicon wafers.

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Bibliographic Details
Title:	Experimental apparatus for measuring noise in MOSFETs on silicon wafers.
Authors:	Comeau, A., Aubin, M., Orchard-Webb, J. H.
Source:	Review of Scientific Instruments; June 1988, Vol. 59, p955-959, 5p
Database:	Applied Science & Technology Source

Description
ISSN:	00346748
DOI:	10.1063/1.1139757