APA (7th ed.) Citation

Comeau, A., Aubin, M., & Orchard-Webb, J. H. (1988). Experimental apparatus for measuring noise in MOSFETs on silicon wafers. Review of Scientific Instruments, 59, 955. https://doi.org/10.1063/1.1139757

Chicago Style (17th ed.) Citation

Comeau, A., M. Aubin, and J. H. Orchard-Webb. "Experimental Apparatus for Measuring Noise in MOSFETs on Silicon Wafers." Review of Scientific Instruments 59 (1988): 955. https://doi.org/10.1063/1.1139757.

MLA (9th ed.) Citation

Comeau, A., et al. "Experimental Apparatus for Measuring Noise in MOSFETs on Silicon Wafers." Review of Scientific Instruments, vol. 59, 1988, p. 955, https://doi.org/10.1063/1.1139757.