Analytical studies on effects of surface recombination on the current amplification factor of alloy junction and surface barrier transistors.

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Bibliographic Details
Title: Analytical studies on effects of surface recombination on the current amplification factor of alloy junction and surface barrier transistors.
Authors: Sugano, T., Yanai, H.
Source: Proceedings of the IRE; October 1960, Vol. 48, p1739-1749, 11p
Database: Applied Science & Technology Source
Description
ISSN:00968390
DOI:10.1109/JRPROC.1960.287546