APA (7th ed.) Citation

Sugano, T., & Yanai, H. (1960). Analytical studies on effects of surface recombination on the current amplification factor of alloy junction and surface barrier transistors. Proceedings of the IRE, 48, 1739. https://doi.org/10.1109/JRPROC.1960.287546

Chicago Style (17th ed.) Citation

Sugano, T., and H. Yanai. "Analytical Studies on Effects of Surface Recombination on the Current Amplification Factor of Alloy Junction and Surface Barrier Transistors." Proceedings of the IRE 48 (1960): 1739. https://doi.org/10.1109/JRPROC.1960.287546.

MLA (9th ed.) Citation

Sugano, T., and H. Yanai. "Analytical Studies on Effects of Surface Recombination on the Current Amplification Factor of Alloy Junction and Surface Barrier Transistors." Proceedings of the IRE, vol. 48, 1960, p. 1739, https://doi.org/10.1109/JRPROC.1960.287546.